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Brad Thiel
Brad Thiel
Professor of Nanoscience, SUNY Polytechnic Institute
Verified email at sunypoly.edu
Title
Cited by
Cited by
Year
Non‐periodic lattice crystals in the hierarchical microstructure of spider (major ampullate) silk
BL Thiel, KB Guess, C Viney
Biopolymers: Original Research on Biomolecules 41 (7), 703-719, 1997
2031997
Radiation damage of water in environmental scanning electron microscopy
CP Royall, BL Thiel, AM Donald
Journal of microscopy 204 (3), 185-195, 2001
1252001
Physical and chemical microstructure of spider dragline: a study by analytical transmission electron microscopy
BL Thiel, DD Kunkel, C Viney
Biopolymers: Original Research on Biomolecules 34 (8), 1089-1097, 1994
1251994
Secondary electron contrast in low-vacuum∕ environmental scanning electron microscopy of dielectrics
BL Thiel, M Toth
Journal of applied physics 97 (5), 2005
1242005
An improved model for gaseous amplification in the environmental SEM
BL Thiel, IC Bache, AL Fletcher, P Meredith, AM Donald
Journal of Microscopy 187 (3), 143-157, 1997
1231997
Direct observation of water− oil emulsion systems in the liquid state by environmental scanning electron microscopy
DJ Stokes, BL Thiel, AM Donald
Langmuir 14 (16), 4402-4408, 1998
1081998
Amplification measurements of alternative imaging gases in environmental SEM
AL Fletcher, BL Thiel, AM Donald
Journal of Physics D: Applied Physics 30 (15), 2249, 1997
1031997
Topographic contrast of partially wetting water droplets in environmental scanning electron microscopy
NA Stelmashenko, JP Craven, AM Donald, EM Terentjev, BL Thiel
Journal of microscopy 204 (2), 172-183, 2001
942001
In situMechanical Testing of Fully Hydrated Carrots (Daucus carota) in the Environmental SEM
BL Thiel, AM Donald
Annals of botany 82 (6), 727-733, 1998
841998
Spider major ampullate silk (drag line): smart composite processing based on imperfect crystals
BL Thiel, C Viney
Journal of Microscopy 185 (2), 179-187, 1997
681997
The elasticity and failure of fluid-filled cellular solids: theory and experiment
M Warner, BL Thiel, AM Donald
Proceedings of the National Academy of Sciences 97 (4), 1370-1375, 2000
622000
Spider (Araneus diadematus) cocoon silk: a case of non-periodic lattice crystals with a twist?
JYJ Barghout, BL Thiel, C Viney
International Journal of Biological Macromolecules 24 (2-3), 211-217, 1999
591999
Applications of environmental scanning electron microscopy to colloidal aggregation and film formation
AM Donald, C He, CP Royall, M Sferrazza, NA Stelmashenko, BL Thiel
Colloids and Surfaces A: Physicochemical and Engineering Aspects 174 (1-2 …, 2000
582000
Tensile mechanical property evaluation of natural and epoxide‐treated silk fibers
DL Dunaway, BL Thiel, C Viney
Journal of applied polymer science 58 (3), 675-683, 1995
531995
High resolution radially symmetric nanostructures from simultaneous electron beam induced etching and deposition
CJ Lobo, M Toth, R Wagner, BL Thiel, M Lysaght
Nanotechnology 19 (2), 025303, 2007
482007
Secondary electron imaging of nonconductors with nanometer resolution
M Toth, WR Knowles, BL Thiel
Applied physics letters 88 (2), 2006
452006
Further advancing the throughput of a multi-beam SEM
T Kemen, M Malloy, B Thiel, S Mikula, W Denk, G Dellemann, D Zeidler
Metrology, Inspection, and Process Control for Microlithography XXIX 9424 …, 2015
372015
Evolution of the nanostructure of deposits grown by electron beam induced deposition
J Li, M Toth, V Tileli, KA Dunn, CJ Lobo, BL Thiel
Applied Physics Letters 93 (2), 2008
372008
Photons, electrons, and acid yields in EUV photoresists: a progress report
R Brainard, E Hassanein, J Li, P Pathak, B Thiel, F Cerrina, R Moore, ...
Advances in Resist Materials and Processing Technology XXV 6923, 662-675, 2008
372008
Photons, electrons, and acid yields in EUV photoresists: a progress report
R Brainard, E Hassanein, J Li, P Pathak, B Thiel, F Cerrina, R Moore, ...
Advances in Resist Materials and Processing Technology XXV 6923, 662-675, 2008
372008
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