Basic mechanisms and modeling of single-event upset in digital microelectronics PE Dodd, LW Massengill IEEE Transactions on nuclear Science 50 (3), 583-602, 2003 | 1431 | 2003 |
Charge collection and charge sharing in a 130 nm CMOS technology OA Amusan, AF Witulski, LW Massengill, BL Bhuva, PR Fleming, ML Alles, ... IEEE Transactions on nuclear science 53 (6), 3253-3258, 2006 | 473 | 2006 |
Single event transients in digital CMOS—A review V Ferlet-Cavrois, LW Massengill, P Gouker IEEE Transactions on Nuclear Science 60 (3), 1767-1790, 2013 | 410 | 2013 |
Monte Carlo simulation of single event effects RA Weller, MH Mendenhall, RA Reed, RD Schrimpf, KM Warren, ... IEEE Transactions on Nuclear Science 57 (4), 1726-1746, 2010 | 279 | 2010 |
Characterization of digital single event transient pulse-widths in 130-nm and 90-nm CMOS technologies B Narasimham, BL Bhuva, RD Schrimpf, LW Massengill, MJ Gadlage, ... IEEE Transactions on Nuclear Science 54 (6), 2506-2511, 2007 | 224 | 2007 |
Simultaneous single event charge sharing and parasitic bipolar conduction in a highly-scaled SRAM design BD Olson, DR Ball, KM Warren, LW Massengill, NF Haddad, SE Doyle, ... IEEE transactions on nuclear science 52 (6), 2132-2136, 2005 | 211 | 2005 |
Impact of scaling on soft-error rates in commercial microprocessors N Seifert, X Zhu, LW Massengill IEEE Transactions on Nuclear Science 49 (6), 3100-3106, 2002 | 202 | 2002 |
Single-event transient pulse quenching in advanced CMOS logic circuits JR Ahlbin, LW Massengill, BL Bhuva, B Narasimham, MJ Gadlage, ... IEEE Transactions on Nuclear Science 56 (6), 3050-3056, 2009 | 198 | 2009 |
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM KM Warren, RA Weller, MH Mendenhall, RA Reed, DR Ball, CL Howe, ... IEEE transactions on nuclear science 52 (6), 2125-2131, 2005 | 194 | 2005 |
A bias-dependent single-event compact model implemented into BSIM4 and a 90 nm CMOS process design kit JS Kauppila, AL Sternberg, ML Alles, AM Francis, J Holmes, OA Amusan, ... IEEE Transactions on nuclear Science 56 (6), 3152-3157, 2009 | 192 | 2009 |
Comparison of combinational and sequential error rates for a deep submicron process NN Mahatme, S Jagannathan, TD Loveless, LW Massengill, BL Bhuva, ... IEEE Transactions on Nuclear Science 58 (6), 2719-2725, 2011 | 186 | 2011 |
SEU modeling and prediction techniques LW Massengill IEEE NSREC Short Course 3, 1-93, 1993 | 179 | 1993 |
Models and algorithmic limits for an ECC-based approach to hardening sub-100-nm SRAMs MA Bajura, Y Boulghassoul, R Naseer, S DasGupta, AF Witulski, ... IEEE Transactions on Nuclear Science 54 (4), 935-945, 2007 | 178 | 2007 |
Neutron-and proton-induced single event upsets for D-and DICE-flip/flop designs at a 40 nm technology node TD Loveless, S Jagannathan, T Reece, J Chetia, BL Bhuva, MW McCurdy, ... IEEE Transactions on Nuclear Science 58 (3), 1008-1014, 2011 | 174 | 2011 |
On-chip characterization of single-event transient pulsewidths B Narasimham, V Ramachandran, BL Bhuva, RD Schrimpf, AF Witulski, ... IEEE Transactions on Device and Materials Reliability 6 (4), 542-549, 2006 | 169 | 2006 |
RHBD techniques for mitigating effects of single-event hits using guard-gates A Balasubramanian, BL Bhuva, JD Black, LW Massengill IEEE Transactions on Nuclear Science 52 (6), 2531-2535, 2005 | 168 | 2005 |
A hardened-by-design technique for RF digital phase-locked loops TD Loveless, LW Massengill, BL Bhuva, WT Holman, AF Witulski, ... IEEE transactions on nuclear science 53 (6), 3432-3438, 2006 | 142 | 2006 |
Impact of ion energy and species on single event effects analysis RA Reed, RA Weller, MH Mendenhall, JM Lauenstein, KM Warren, ... IEEE Transactions on Nuclear Science 54 (6), 2312-2321, 2007 | 141 | 2007 |
Single event upsets in deep-submicrometer technologies due to charge sharing OA Amusan, LW Massengill, MP Baze, AL Sternberg, AF Witulski, ... IEEE Transactions on Device and Materials Reliability 8 (3), 582-589, 2008 | 140 | 2008 |
HBD layout isolation techniques for multiple node charge collection mitigation JD Black, AL Sternberg, ML Alles, AF Witulski, BL Bhuva, LW Massengill, ... IEEE transactions on nuclear science 52 (6), 2536-2541, 2005 | 135 | 2005 |