| SCEMIT: A SystemC Error and Mutation Injection Tool P Lisherness, KT Cheng Design Automation Conference (DAC), 2010 | 57 | 2010 |
| Power-Efficient Calibration and Reconfiguration for Optical Network-on-Chip Y Zheng, P Lisherness, M Gao, J Bovington, KT Cheng, H Wang, S Yang Journal of Optical Communications and Networking, 2012 | 41 | 2012 |
| A cost analysis framework for multi-core systems with spares S Shamshiri, P Lisherness, SJ Pan, KT Cheng International Test Conference (ITC), 2008 | 41 | 2008 |
| Functional Fabric Based Test Wrapper for Circuit Testing of IP Blocks S Patil, A Jas, P Lisherness US Patent 20,120,233,514, 2012 | 35 | 2012 |
| Time-Multiplexed Online Checking M Gao, HM Chang, P Lisherness, KT Cheng IEEE Transactions on Computers 60 (9), 1300-1312, 2011 | 17 | 2011 |
| Post-silicon bug detection for variation induced electrical bugs M Gao, P Lisherness, KT Cheng Asia and South Pacific Design Automation Conference (ASP-DAC), 2011 | 14 | 2011 |
| An instrumented observability coverage method for system validation P Lisherness, KT Cheng High Level Design Validation and Test Workshop (HLDVT), 2009 | 14 | 2009 |
| Functional Fabric Based Test Controller for Functional and Structural Test and Debug S Patil, A Jas, P Lisherness, E Carrieri US Patent 20,120,232,825, 2012 | 13 | 2012 |
| Time-multiplexed online checking: a feasibility study M Gao, HM Chang, P Lisherness, KT Cheng Asian Test Symposium (ATS), 2008 | 13 | 2008 |
| On Error Modeling of Electrical Bugs for Post-Silicon Timing Validation M Gao, P Lisherness, KT Cheng, JJ Liou Asia and South Pacific Design Automation Conference (ASP-DAC), 2012 | 11 | 2012 |
| Mutation Analysis with Coverage Discounting P Lisherness, N Lesperance, KT Cheng Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013, 31-34, 2013 | 10 | 2013 |
| Coverage discounting: A generalized approach for testbench qualification P Lisherness, KT Cheng High Level Design Validation and Test Workshop (HLDVT), 2011 | 9 | 2011 |
| Power-efficient calibration and reconfiguration for optical network-on-chip Z Yan, P Lisherness, G Ming, J Bovington, C Kwang-Ting, W Hong, ... IEEE OSA JOURNAL OF OPTICAL COMMUNICATIONS AND NETWORKING 4 (12), 955-966, 2012 | 6 | 2012 |
| Post-Fabrication Reconfiguration for Power-Optimized Tuning of Optically Connected Multi-Core Systems Y Zheng, P Lisherness, S Shamshiri, A Ghofrani, S Yang, KT Cheng Asia and South Pacific Design Automation Conference (ASP-DAC), 2012 | 6 | 2012 |
| Improving Validation Coverage Metrics to Account for Limited Observability P Lisherness, KT Cheng Asia and South Pacific Design Automation Conference (ASP-DAC), 2012 | 4 | 2012 |
| Adaptive test selection for post-silicon timing validation: A data mining approach M Gao, P Lisherness, KT Cheng International Test Conference (ITC), 2012 | 2 | 2012 |
| Coverage Discounting: Improved Testbench Qualification by Combining Mutation Analysis with Functional Coverage N Lesperance, P Lisherness, KTT Cheng SRC TechCon, 2013 | | 2013 |
| Power-Efficient Calibration and Reconfiguration for On-Chip Optical Communication Y Zheng, P Lisherness, M Gao, J Bovington, S Yang, KT Cheng Design, Automation and Test in Europe (DATE), 2012 | | 2012 |
Kwang-Ting (Tim) ChengChair Professor of ECE and CSE, HKUSTVerified email at ust.hk
