| One fault is all it needs: Breaking higher-order masking with persistent fault analysis J Pan, F Zhang, K Ren, S Bhasin 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2019 | 20 | 2019 |
| Automatic Routability Predictor Development Using Neural Architecture Search CC Chang, J Pan, T Zhang, Z Xie, J Hu, W Qi, CW Lin, R Liang, J Mitra, ... 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 1-9, 2021 | 19 | 2021 |
| Preplacement net length and timing estimation by customized graph neural network Z Xie, R Liang, X Xu, J Hu, CC Chang, J Pan, Y Chen IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 16 | 2022 |
| Towards collaborative intelligence: Routability estimation based on decentralized private data J Pan, CC Chang, Z Xie, A Li, M Tang, T Zhang, J Hu, Y Chen Proceedings of the 59th ACM/IEEE Design Automation Conference, 961-966, 2022 | 9 | 2022 |
| DEEP: Developing extremely efficient runtime on-chip power meters Z Xie, S Li, M Ma, CC Chang, J Pan, Y Chen, J Hu Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided …, 2022 | 6 | 2022 |
| Lithography hotspot detection via heterogeneous federated learning with local adaptation X Lin, J Pan, J Xu, Y Chen, C Zhuo 2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC), 166-171, 2022 | 6 | 2022 |
| Rethink before releasing your model: ML model extraction attack in EDA CC Chang, J Pan, Z Xie, J Hu, Y Chen Proceedings of the 28th Asia and South Pacific Design Automation Conference …, 2023 | 4 | 2023 |
| The dark side: security concerns in machine learning for EDA Z Xie, J Pan, CC Chang, Y Chen arXiv preprint arXiv:2203.10597, 2022 | 4 | 2022 |
| PANDA: Architecture-level power evaluation by unifying analytical and machine learning solutions Q Zhang, S Li, G Zhou, J Pan, CC Chang, Y Chen, Z Xie 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD), 01-09, 2023 | 2 | 2023 |
| Robustify ML-Based Lithography Hotspot Detectors J Pan, CC Chang, Z Xie, J Hu, Y Chen Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided …, 2022 | 2 | 2022 |
| The Dark Side: Security and Reliability Concerns in Machine Learning for EDA Z Xie, J Pan, CC Chang, J Hu, Y Chen IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 2 | 2022 |
| Deep learning for routability Z Xie, J Pan, CC Chang, R Liang, EC Barboza, Y Chen Machine learning applications in electronic design automation, 35-61, 2022 | 2 | 2022 |
| Fully automated machine learning model development for analog placement quality prediction CC Chang, J Pan, Z Xie, Y Li, Y Lin, J Hu, Y Chen Proceedings of the 28th Asia and South Pacific Design Automation Conference …, 2023 | 1 | 2023 |
| EDALearn: A Comprehensive RTL-to-Signoff EDA Benchmark for Democratized and Reproducible ML for EDA Research J Pan, CC Chang, Z Xie, Y Chen arXiv preprint arXiv:2312.01674, 2023 | | 2023 |
| Lithography Hotspot Detection Based on Heterogeneous Federated Learning with Local Adaptation and Feature Selection J Pan, X Lin, J Xu, Y Chen, C Zhuo IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023 | | 2023 |
| Towards Fully Automated Machine Learning for Routability Estimator Development CC Chang, J Pan, Z Xie, T Zhang, J Hu, Y Chen IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023 | | 2023 |
| Persistence Wears Down Resistance: Persistent Fault Analysis on Unprotected and Protected Block Cipher Implementations S Bhasin, J Pan, F Zhang | | |
Yiran ChenJohn Cocke Distinguished Professor of Electrical and Computer Engineering, Duke UniversityVerified email at duke.edu
