| Orientation imaging: the emergence of a new microscopy BL Adams, SI Wright, K Kunze Metallurgical and Materials Transactions A 24 (4), 819-831, 1993 | 1297 | 1993 |
| A review of strain analysis using electron backscatter diffraction SI Wright, MM Nowell, DP Field Microscopy and Microanalysis 17 (03), 316-329, 2011 | 1256 | 2011 |
| EBSD image quality mapping SI Wright, MM Nowell Microscopy and microanalysis 12 (1), 72-84, 2006 | 405 | 2006 |
| Automatic analysis of electron backscatter diffraction patterns SI Wright, BL Adams Metallurgical and Materials Transactions A 23 (3), 759-767, 1992 | 353 | 1992 |
| Three-dimensional orientation microscopy in a focused ion beam–scanning electron microscope: A new dimension of microstructure characterization S Zaefferer, SI Wright, D Raabe Metallurgical and Materials Transactions A 39 (2), 374-389, 2008 | 265 | 2008 |
| Analysis of local orientation gradients in deformed single crystals DP Field, PB Trivedi, SI Wright, M Kumar Ultramicroscopy 103 (1), 33-39, 2005 | 252 | 2005 |
| Introduction and comparison of new EBSD post-processing methodologies SI Wright, MM Nowell, SP Lindeman, PP Camus, M De Graef, MA Jackson Ultramicroscopy 159, 81-94, 2015 | 202 | 2015 |
| Advances in automatic EBSP single orientation measurements K Kunze, SI Wright, BL Adams, DJ Dingley Texture, Stress, and Microstructure 20 (1-4), 41-54, 1993 | 202 | 1993 |
| Extracting twins from orientation imaging microscopy scan data SI Wright, RJ Larsen Journal of microscopy 205 (3), 245-252, 2002 | 189 | 2002 |
| A review of automated orientation imaging microscopy(OIM) SI Wright Journal of Computer-Assisted Microscopy(USA) 5 (3), 207-221, 1993 | 175 | 1993 |
| Orientation effects on indexing of electron backscatter diffraction patterns MM Nowell, SI Wright Ultramicroscopy 103 (1), 41-58, 2005 | 128 | 2005 |
| Electron imaging with an EBSD detector SI Wright, MM Nowell, R de Kloe, P Camus, T Rampton Ultramicroscopy 148, 132-145, 2015 | 125 | 2015 |
| Phase differentiation via combined EBSD and XEDS MM Nowell, SI Wright Journal of microscopy 213 (3), 296-305, 2004 | 121 | 2004 |
| Description of orientation coherence in polycrystalline materials BL Adams, PR Morris, TT Wang, KS Willden, SI Wright Acta Metallurgica 35 (12), 2935-2946, 1987 | 113 | 1987 |
| A comparison of textures measured using X-ray and electron backscatter diffraction SI Wright, MM Nowell, JF Bingert Metallurgical and Materials Transactions A 38 (8), 1845-1855, 2007 | 89 | 2007 |
| Advances in deformation twin characterization using electron backscattered diffraction data TA Mason, JF Bingert, GC Kaschner, SI Wright, RJ Larsen Metallurgical and Materials Transactions A 33 (13), 949-954, 2002 | 82 | 2002 |
| Application of a new automatic lattice orientation measurement technique to polycrystalline aluminum SI Wright, BL Adams, K Kunze Materials Science and Engineering: A 160 (2), 229-240, 1993 | 78 | 1993 |
| Error analysis of the crystal orientations obtained by the dictionary approach to EBSD indexing F Ram, S Wright, S Singh, M De Graef Ultramicroscopy 181, 17-26, 2017 | 76 | 2017 |
| Recent studies of local texture and its influence on failure SI Wright, DP Field Materials Science and Engineering: A 257 (1), 165-170, 1998 | 75 | 1998 |
| An analysis of grain boundaries and grain growth in cemented tungsten carbide using orientation imaging microscopy V Kumar, ZZ Fang, SI Wright, MM Nowell Metallurgical and Materials Transactions A 37 (3), 599-607, 2006 | 73 | 2006 |
David FieldProfessor, School of Mechanical and Materials Engineering, Washington State UniversityE-mailová adresa ověřena na: wsu.edu
