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madhup shukla
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Year
Electrical properties of reactive-ion-sputtered Al2O3 on 4H-SiC
M Shukla, G Dutta, R Mannam, N DasGupta
Thin Solid Films 607, 1-6, 2016
142016
Analysis of gate leakage current in ultra-thin oxide grown by high water vapor pressure thermal oxidation on 4H-SiC
M Shukla, N DasGupta
2014 IEEE 2nd International Conference on Emerging Electronics (ICEE), 1-4, 2014
2014
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Articles 1–2