| Defects inspection in polycrystalline solar cells electroluminescence images using deep learning MRU Rahman, H Chen IEEE Access 8, 40547-40558, 2020 | 61 | 2020 |
| Surface defect detection of solar cells based on feature pyramid network and GA-faster-RCNN L Liu, Y Zhu, MRU Rahman, P Zhao, H Chen 2019 2nd China Symposium on Cognitive Computing and Hybrid Intelligence …, 2019 | 23 | 2019 |
| Adversarial branch architecture search for unsupervised domain adaptation L Robbiano, MRU Rahman, F Galasso, B Caputo, FM Carlucci Proceedings of the IEEE/CVF winter conference on applications of computer …, 2022 | 13 | 2022 |
| Boosting RGB-D salient object detection with adaptively cooperative dynamic fusion network J Zhu, X Zhang, X Fang, MRU Rahman, F Dong, Y Li, S Yan, P Tan Knowledge-Based Systems 251, 109205, 2022 | 9 | 2022 |
| Efficient and refined deep convolutional features network for the crack segmentation of solar cell electroluminescence images C Wang, H Chen, S Zhao, MRU Rahman IEEE Transactions on Semiconductor Manufacturing 35 (4), 610-619, 2022 | 8 | 2022 |
| Fractional‐order PID servo control based on decoupled visual model W Liu, GB Bian, MRU Rahman, H Zhang, H Chen, W Wu International Journal of Adaptive Control and Signal Processing 33 (8), 1265 …, 2019 | 6 | 2019 |
| U-Net based defects inspection in photovoltaic electroluminecscence images MRU Rahman, H Chen, W Xi 2019 IEEE International Conference on Big Knowledge (ICBK), 215-220, 2019 | 4 | 2019 |
| Best Practices for 2-Body Pose Forecasting MRU Rahman, L Scofano, E De Matteis, A Flaborea, A Sampieri, ... Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2023 | 1 | 2023 |
| Fractional order visual servo control for fillet seam tracking W Liu, H Zhang, MRU Rahman, P Chen, P Yang, H Chen 2018 IEEE 8th Annual International Conference on CYBER Technology in …, 2018 | 1 | 2018 |
| Multi Attention U-net Based Defects Inspection in Polycrystalline Solar Cell Electroluminescence Images MRU Rahman 河北工业大学, 2020 | | 2020 |
| Best Practices for 2-Body Pose Forecasting–Supplementary Material– MRU Rahman, L Scofano, E De Matteis, A Flaborea, A Sampieri, ... | | |
| Yield Modeling, Analysis, and Enhancement Commonality Analysis for Detecting Failures Caused by Inspection Tools in Semiconductor Manufacturing Processes … C Wang, H Chen, S Zhao, MRU Rahman, K Kajiwara, K Eriguchi, ... | | |
| Adversarial Branch Architecture Search for Unsupervised Domain Adaptation Supplementary L Robbiano, MRU Rahman, F Galasso, B Caputo, FM Carlucci | | |
Fabio GalassoSapienza University of RomeE-mailová adresa ověřena na: uniroma1.it
