| Molecular beam epitaxy growth of S Tixier, M Adamcyk, T Tiedje, S Francoeur, A Mascarenhas, P Wei, ... Applied physics letters 82 (14), 2245-2247, 2003 | 519 | 2003 |
| Band gap of S Francoeur, MJ Seong, A Mascarenhas, S Tixier, M Adamcyk, T Tiedje Applied physics letters 82 (22), 3874-3876, 2003 | 497 | 2003 |
| Giant Spin-Orbit Bowing in B Fluegel, S Francoeur, A Mascarenhas, S Tixier, EC Young, T Tiedje Physical review letters 97 (6), 067205, 2006 | 489 | 2006 |
| Surfactant enhanced growth of GaNAs and InGaNAs using bismuth S Tixier, M Adamcyk, EC Young, JH Schmid, T Tiedje Journal of crystal growth 251 (1-4), 449-454, 2003 | 152 | 2003 |
| Bismuth surfactant growth of the dilute nitride GaNxAs1− x EC Young, S Tixier, T Tiedje Journal of crystal growth 279 (3-4), 316-320, 2005 | 105 | 2005 |
| Bi isoelectronic impurities in GaAs S Francoeur, S Tixier, E Young, T Tiedje, A Mascarenhas Physical Review B 77 (8), 085209, 2008 | 98 | 2008 |
| Band gaps of the dilute quaternary alloys GaNxAs1− x− yBiy and Ga1− yInyNxAs1− x S Tixier, SE Webster, EC Young, T Tiedje, S Francoeur, A Mascarenhas, ... Applied Physics Letters 86 (11), 2005 | 95 | 2005 |
| Active cloud point controller for refining applications and related method GE Stewart, JT Donner, S Tixier, FM Haran, CP Luebke US Patent 9,223,301, 2015 | 77 | 2015 |
| A new fabrication process for Ni–Ti shape memory thin films T Lehnert, S Tixier, P Böni, R Gotthardt Materials Science and Engineering: A 273, 713-716, 1999 | 71 | 1999 |
| Hardness enhancement of sputtered Ni3Al/Ni multilayers S Tixier, P Böni, H Van Swygenhoven Thin Solid Films 342 (1-2), 188-193, 1999 | 44 | 1999 |
| Grazing-incidence diffraction from multilayers GT Baumbach, S Tixier, U Pietsch, V Holı Physical Review B 51 (23), 16848, 1995 | 44 | 1995 |
| Bi-induced vibrational modes in GaAsBi MJ Seong, S Francoeur, S Yoon, A Mascarenhas, S Tixier, M Adamcyk, ... Superlattices and Microstructures 37 (6), 394-400, 2005 | 36 | 2005 |
| Spectroscopic sensor for measuring sheet properties S Tixier, DA Gordon, FM Haran US Patent 7,382,456, 2008 | 29 | 2008 |
| Ion beam characterization of GaAs1− x− yNxBiy epitaxial layers P Wei, S Tixier, M Chicoine, S Francoeur, A Mascarenhas, T Tiedje, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004 | 29 | 2004 |
| Challenges in the field of large-m supermirrors P Böni, D Clemens, MS Kumar, S Tixier Physica B: Condensed Matter 241, 1060-1067, 1997 | 27 | 1997 |
| Spectroscopy having correction for broadband distortion for analyzing multi-component samples FM Haran, R Meijer-Drees, S Tixier US Patent 7,868,296, 2011 | 25 | 2011 |
| Stress minimisation in sputtered Ni/Ti supermirrors MS Kumar, P Böni, S Tixier, D Clemens Physica B: Condensed Matter 241, 95-97, 1997 | 22 | 1997 |
| Electron densities for the outer valence orbitals of pyridine: comparison of EMS measurements with near Hartree–Fock limit and density functional theory calculations S Tixier, WA Shapley, Y Zheng, DP Chong, CE Brion, Z Shi, S Wolfe Chemical Physics 270 (2), 263-276, 2001 | 21 | 2001 |
| Apparatus and method for controlling autotroph cultivation AM Fuxman, S Tixier, GE Stewart, FM Haran, JU Backstrom, K Gerbrandt US Patent 8,478,444, 2013 | 19 | 2013 |
| Use of fluorescent nanoparticles to measure individual layer thicknesses or composition in multi-layer films and to calibrate secondary measurement devices MKY Hughes, S Tixier US Patent 7,858,953, 2010 | 19 | 2010 |
