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Thierry Mélin
Thierry Mélin
IEMN-CNRS
Verified email at iemn.fr
Title
Cited by
Cited by
Year
Studies of multiwall carbon nanotubes using Raman spectroscopy and atomic force microscopy
M Zdrojek, W Gebicki, C Jastrzebski, T Melin, A Huczko
Solid State Phenomena 99, 265-268, 2004
1392004
Electric force microscopy of individually charged nanoparticles on conductors: an analytical model for quantitative charge imaging
T Mélin, H Diesinger, D Deresmes, D Stiévenard
Physical Review B 69 (3), 035321, 2004
1152004
Surface potential of n-and p-type GaN measured by Kelvin force microscopy
S Barbet, R Aubry, MA di Forte-Poisson, JC Jacquet, D Deresmes, T Melin, ...
Applied Physics Letters 93 (21), 2008
902008
Charge injection in individual silicon nanoparticles deposited on a conductive substrate
T Melin, D Deresmes, D Stiévenard
Applied physics letters 81 (26), 5054-5056, 2002
772002
Charging and discharging processes of carbon nanotubes probed by electrostatic force microscopy
M Zdrojek, T Melin, H Diesinger, D Stiévenard, W Gebicki, L Adamowicz
Journal of applied physics 100 (11), 2006
732006
Probing nanoscale dipole-dipole interactions by electric force microscopy
T Melin, H Diesinger, D Deresmes, D Stiévenard
Physical review letters 92 (16), 166101, 2004
702004
High-resolution kelvin probe force microscopy imaging of interface dipoles and photogenerated charges in organic donor–acceptor photovoltaic blends
F Fuchs, F Caffy, R Demadrille, T Mélin, B Grévin
ACS nano 10 (1), 739-746, 2016
662016
Cross-talk artefacts in Kelvin probe force microscopy imaging: a comprehensive study
S Barbet, M Popoff, H Diesinger, D Deresmes, D Theron, T Melin
Journal of Applied Physics 115 (14), 2014
612014
Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy
E Palleau, L Ressier, T Mélin
Nanotechnology 21 (22), 225706, 2010
612010
Thermally assisted formation of silicon islands on a silicon-on-insulator substrate
B Legrand, V Agache, T Melin, JP Nys, V Senez, D Stiévenard
Journal of applied physics 91 (1), 106-111, 2002
492002
Exciton formation and relaxation dynamics in quantum wires
R Kumar, AS Vengurlekar, AV Gopal, T Mélin, F Laruelle, B Etienne, ...
Physical review letters 81 (12), 2578, 1998
431998
Charging and emission effects of multiwalled carbon nanotubes probed by electric force microscopy
M Zdrojek, T Melin, C Boyaval, D Stiévenard, B Jouault, M Wozniak, ...
Applied Physics Letters 86 (21), 2005
412005
Localization and delocalization of charges injected in DNA
T Heim, T Melin, D Deresmes, D Vuillaume
Applied physics letters 85 (13), 2637-2639, 2004
392004
Electric charge enhancements in carbon nanotubes: theory and experiments
Z Wang, M Zdrojek, T Mélin, M Devel
Physical Review B—Condensed Matter and Materials Physics 78 (8), 085425, 2008
372008
Dispersive charge transport along the surface of an insulating layer observed by electrostatic force microscopy
J Lambert, G de Loubens, C Guthmann, M Saint-Jean, T Mélin
Physical Review B—Condensed Matter and Materials Physics 71 (15), 155418, 2005
372005
Electrostatic force microscopy and Kelvin force microscopy as a probe of the electrostatic and electronic properties of carbon nanotubes
T Mélin, M Zdrojek, D Brunel
Scanning probe microscopy in nanoscience and nanotechnology, 89-128, 2010
352010
Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy
T Melin, S Barbet, H Diesinger, D Théron, D Deresmes
Review of scientific instruments 82 (3), 2011
342011
Kelvin force microscopy at the second cantilever resonance: An out-of-vacuum crosstalk compensation setup
H Diesinger, D Deresmes, JP Nys, T Melin
Ultramicroscopy 108 (8), 773-781, 2008
322008
Inner-shell charging of multiwalled carbon nanotubes
M Zdrojek, T Heim, D Brunel, A Mayer, T Melin
Physical Review B—Condensed Matter and Materials Physics 77 (3), 033404, 2008
302008
Determination of the electrostatic lever arm of carbon nanotube field effect transistors using Kelvin force microscopy
D Brunel, D Deresmes, T Mélin
Applied Physics Letters 94 (22), 2009
282009
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