| Modeling SRAM start-up behavior for physical unclonable functions M Cortez, A Dargar, S Hamdioui, GJ Schrijen 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2012 | 123 | 2012 |
| Adapting Voltage Ramp-up Time for Temperature Noise Reduction on Memory-based PUFs M Cortez, S Hamdioui, V van der Leest, R Maes, GJ Schrijen (HOST) IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013 | 47 | 2013 |
| Intelligent Voltage Ramp-up Time Adaptation for Temperature Noise Reduction on Memory-based PUF Systems M Cortez, S Hamdioui, A Kaichouhi, V van der Leest, R Maes, GJ Schrijen IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2015 | 28 | 2015 |
| Testing PUF-based Secure Key Storage Circuits A Cortez, G Roelofs, S Hamdioui, G di Natale Design, Automation and Test in Europe Conference and Exhibition (DATE), 1-6, 2014 | 16 | 2014 |
| Design Dependent SRAM PUF Robustness Analysis A Cortez, S Hamdioui, R Ishihara 16th IEEE Latin-American Test Symposium, 1-6, 2015 | 6 | 2015 |
| Testing Methods for PUF-Based Secure Key Storage Circuits M Cortez, G Roelofs, S Hamdioui, G di Natale Journal of Electronic Testing: Theory and Applications (JETTA) 30 (5), 581-594, 2014 | 2 | 2014 |
| Reliability Assessment and Test Methods for Anti-counterfeiting Technology AM Monteiro Oliveira Cortez Delft University of Technology, 2015 | | 2015 |
| Multi-segment Enhanced Scan-chains for Secure ICs M Cortez, S Hamdioui, G Di Natale, ML Flottes, B Rouzeyre, I Polian TRUDEVICE Workshop, 2015 | | 2015 |
| Hierarchical Secure DfT M Cortez, S Hamdioui, G Di Natale, ML Flottes, B Rouzeyre TRUDEVICE Workshop, 2015 | | 2015 |
| Secure Test Method for Fuzzy Extractor M Cortez, G Roelofs, S Hamdioui, G Di Natale Joint MEDIAN-TRUDEVICE Open Forum, 2014 | | 2014 |
| Noise Reduction on Memory-based PUFs M Cortez, S Hamdioui, V van der Leest, R Maes, GJ Schrijen (TRUDEVICE) First Workshop on Trustworthy Manufacturing and Utilization of …, 2013 | | 2013 |
Said HamdiouiDelft University of TechnologyVerified email at tudelft.nl
