Real‐time scanning Hall probe microscopy A Oral, SJ Bending, M Henini Applied physics letters 69 (9), 1324-1326, 1996 | 334 | 1996 |
A novel force microscope and point contact probe SP Jarvis, A Oral, TP Weihs, JB Pethica Review of scientific instruments 64 (12), 3515-3520, 1993 | 157 | 1993 |
Energy dissipation in atomic force microscopy and atomic loss processes PM Hoffmann, S Jeffery, JB Pethica, HÖ Özer, A Oral Physical Review Letters 87 (26), 265502, 2001 | 149 | 2001 |
Direct measurement of molecular stiffness and damping in confined water layers S Jeffery, PM Hoffmann, JB Pethica, C Ramanujan, HÖ Özer, A Oral Physical Review B 70 (5), 054114, 2004 | 141 | 2004 |
Scanning Hall probe microscopy of superconductors and magnetic materials A Oral, SJ Bending, M Henini Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996 | 117 | 1996 |
Manipulation of atoms across a surface at room temperature TW Fishlock, A Oral, RG Egdell, JB Pethica Nature 404 (6779), 743-745, 2000 | 113 | 2000 |
50 nm Hall sensors for room temperature scanning Hall probe microscopy A Sandhu, K Kurosawa, M Dede, A Oral Japanese journal of applied physics 43 (2R), 777, 2004 | 112 | 2004 |
Direct Observation of Melting of the Vortex Solid in Single Crystals A Oral, JC Barnard, SJ Bending, II Kaya, S Ooi, T Tamegai, M Henini Physical review letters 80 (16), 3610, 1998 | 83 | 1998 |
Solid or liquid? Solidification of a nanoconfined liquid under nonequilibrium conditions S Patil, G Matei, A Oral, PM Hoffmann Langmuir 22 (15), 6485-6488, 2006 | 80 | 2006 |
Hall effect in a highly inhomogeneous magnetic field distribution SJ Bending, A Oral Journal of Applied Physics 81 (8), 3721-3725, 1997 | 78 | 1997 |
Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope PM Hoffmann, A Oral, RA Grimble, H Özgür Özer, S Jeffery, JB Pethica Proceedings of the Royal Society of London. Series A: Mathematical, Physical …, 2001 | 74 | 2001 |
Nano and micro Hall-effect sensors for room-temperature scanning hall probe microscopy A Sandhu, A Okamoto, I Shibasaki, A Oral Microelectronic Engineering 73, 524-528, 2004 | 66 | 2004 |
High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and … A Oral, RA Grimble, HÖ Özer, JB Pethica Review of Scientific Instruments 74 (8), 3656-3663, 2003 | 63 | 2003 |
Integrated piezoresistive sensors for atomic force-guided scanning Hall probe microscopy AJ Brook, SJ Bending, J Pinto, A Oral, D Ritchie, H Beere, M Henini, ... Applied physics letters 82 (20), 3538-3540, 2003 | 58 | 2003 |
A highly sensitive atomic force microscope for linear measurements of molecular forces in liquids S Patil, G Matei, H Dong, PM Hoffmann, M Karaköse, A Oral Review of Scientific Instruments 76 (10), 2005 | 56 | 2005 |
High sensitivity and multifunctional micro-Hall sensors fabricated using InAlSb/InAsSb/InAlSb heterostructures M Bando, T Ohashi, M Dede, R Akram, A Oral, SY Park, I Shibasaki, ... Journal of Applied Physics 105 (7), 2009 | 52 | 2009 |
Room temperature scanning Hall probe microscopy using GaAs/AlGaAs and Bi micro-hall probes A Sandhu, H Masuda, A Oral, SJ Bending, A Yamada, M Konagai Ultramicroscopy 91 (1-4), 97-101, 2002 | 48 | 2002 |
Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy A Oral, RA Grimble, HÖ Özer, PM Hoffmann, JB Pethica Applied Physics Letters 79 (12), 1915-1917, 2001 | 48 | 2001 |
Room-temperature scanning Hall probe microscope (RT-SHPM) imaging of garnet films using new high-performance InSb sensors A Oral, A Kaval, M Dede, H Masuda, A Okamoto, I Shibasaki, A Sandhu IEEE Transactions on Magnetics 38 (5), 2438-2440, 2002 | 44 | 2002 |
Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy A Sandhu, H Masuda, K Kurosawa, A Oral, SJ Bending Electronics Letters 37 (22), 1335-1336, 2001 | 43 | 2001 |