| Susceptibility of some electronic equipment to HPEM threats D Nitsch, M Camp, F Sabath, JL ter Haseborg, H Garbe IEEE transactions on Electromagnetic Compatibility 46 (3), 380-389, 2004 | 381 | 2004 |
| Simulating the multipath channel with a reverberation chamber: Application to bit error rate measurements E Genender, CL Holloway, KA Remley, JM Ladbury, G Koepke, H Garbe IEEE Transactions on electromagnetic compatibility 52 (4), 766-777, 2010 | 201 | 2010 |
| Predicting the breakdown behavior of microcontrollers under EMP/UWB impact using a statistical analysis M Camp, H Gerth, H Garbe, H Haase IEEE Transactions on Electromagnetic Compatibility 46 (3), 368-379, 2004 | 153 | 2004 |
| Probabilistic risk analysis technique of intentional electromagnetic interference at system level E Genender, H Garbe, F Sabath IEEE Transactions on Electromagnetic Compatibility 56 (1), 200-207, 2013 | 116 | 2013 |
| Influence of the technology on the destruction effects of semiconductors by impact of EMP and UWB pulses M Camp, H Garbe, D Nitsch 2002 IEEE International Symposium on Electromagnetic Compatibility 1, 87-92, 2002 | 104 | 2002 |
| UWB and EMP susceptibility of modern electronics M Camp, H Garbe, D Nitsch 2001 IEEE EMC International Symposium. Symposium Record. International …, 2001 | 93 | 2001 |
| Susceptibility of personal computer systems to fast transient electromagnetic pulses M Camp, H Garbe IEEE Transactions on Electromagnetic Compatibility 48 (4), 829-833, 2006 | 89 | 2006 |
| Use of reverberation chamber to simulate the power delay profile of a wireless environment E Genender, CL Holloway, KA Remley, J Ladbury, G Koepke, H Garbe 2008 International Symposium on Electromagnetic Compatibility-EMC Europe, 1-6, 2008 | 66 | 2008 |
| Parameter estimation of double exponential pulses (EMP, UWB) with least squares and Nelder Mead algorithm M Camp, H Garbe IEEE transactions on electromagnetic compatibility 46 (4), 675-678, 2004 | 66 | 2004 |
| TEM waveguides for EMC measurements C Groh, JP Karst, M Koch, H Garbe IEEE Transactions on Electromagnetic Compatibility 41 (4), 440-445, 1999 | 53 | 1999 |
| Risk potential of radiated HPEM environments F Sabath, H Garbe 2009 IEEE International Symposium on Electromagnetic Compatibility, 226-231, 2009 | 52 | 2009 |
| Calculable field generation using TEM cells applied to the calibration of a novel E-field probe JP Karst, C Groh, H Garbe IEEE transactions on electromagnetic compatibility 44 (1), 59-71, 2002 | 51 | 2002 |
| Hardware and software simulation of transient pulse impact on integrated circuits S Korte, M Camp, H Garbe 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC …, 2005 | 46 | 2005 |
| UWB and EMP susceptibility of modern microprocessorboards D Nitsch, M Camp, H Friedhoff, J Maak, F Sabath, H Garbe EMC Europe, 345-350, 2000 | 36 | 2000 |
| UWB and EMP susceptibility of microprocessors and networks C Mojert, D Nitsch, H Friedjoff, J Maack, F Sabath, M Camp, G Garbe Proceedings of the 14th International Zürich Symposium EMC, 47-52, 2001 | 34 | 2001 |
| Elektrotechnik H Haase, H Garbe Springer-Lehrbuch, 1998 | 30 | 1998 |
| Emp generator H Garbe, D Hansen, D Konigstein US Patent 4,845,378, 1989 | 30 | 1989 |
| Radiation analysis of PCB layout using a hybrid MoM-MTL method F Sabath, H Garbe IEEE transactions on electromagnetic compatibility 45 (2), 424-435, 2003 | 28 | 2003 |
| A cost-efficient system for detecting an intentional electromagnetic interference (IEMI) attack JF Dawson, ID Flintoft, P Kortoci, L Dawson, AC Marvin, MP Robinson, ... 2014 International Symposium on Electromagnetic Compatibility, 1252-1256, 2014 | 27 | 2014 |
| The GTEM cell concept; applications of this new EMC test environment to radiated emission and susceptibility measurements H Garbe, D Hansen Seventh International Conference on Electromagnetic Compatibility, 1990, 152-156, 1990 | 25 | 1990 |
