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Co-authors
G J ShifletProfessor of Materials Science, University of VirginiaVerified email at virginia.edu
Terry TrittProfessor of Physics, Clemson UniversityVerified email at g.clemson.edu
Takeshi EgamiProfessor of Materials Science and Physics, University of TennesseeVerified email at utk.edu
William L. JohnsonCalifornia Institute of TechnologyVerified email at caltech.edu
Jack SimonsonFarmingdale State CollegeVerified email at farmingdale.edu
SA WolfUniversity of VirginiaVerified email at virginia.edu
Wenjie XieTechnische Universität DarmstadtVerified email at mr.tu-darmstadt.de
Despina LoucaProfessor of Physics, University of VirginiaVerified email at virginia.edu
J GopalakrishnanSolid State and structural Chemistry Unit, Indian Institute of Science, Bangalore, IndiaVerified email at iisc.ac.in
Jian HeClemson UniversityVerified email at clemson.edu
Di WuShaanxi Normal University/Southern University of Science and Technology/University of VirginiaVerified email at snnu.edu.cn
Eugene ChenSamsung, Grandis, Cypress Semiconductor, Motorola, NVEVerified email at samsung.com
Mircea R. StanVirginia Microelectronics Consortium (VMEC) Professor, University of VirginiaVerified email at virginia.edu
Xinfeng Tang (唐新峰)Wuhan University of TechnologyVerified email at whut.edu.cn
Dmytro ApalkovPrincipal Engineer/Director, Modeling, Samsung Semiconductor R&DVerified email at samsung.com
anke weidenkaffTU DarmstadtVerified email at mr.tu-darmstadt.de
Rama VenkatasubramanianJohns Hopkins University Applied Physics LabVerified email at jhuapl.edu
Jiwei LuAFOSR
S. Joseph Poon
Verified email at virginia.edu