The effect of vacancies on the microwave surface resistance of niobium revealed by positron annihilation spectroscopy A Romanenko, CJ Edwardson, PG Coleman, PJ Simpson Applied Physics Letters 102 (23), 2013 | 36 | 2013 |
Positron annihilation studies of the AlOx/SiO2/Si interface in solar cell structures CJ Edwardson, PG Coleman, TTA Li, A Cuevas, S Ruffell Journal of Applied Physics 111 (5), 2012 | 18 | 2012 |
Positron annihilation studies of fluorine-vacancy complexes in phosphorus-and fluorine-implanted germanium CJ Edwardson, PG Coleman, HAW El Mubarek Semiconductor Science and Technology 29 (3), 035005, 2014 | 8 | 2014 |
The evolution of vacancy-type defects in silicon-on-insulator structures studied by positron annihilation spectroscopy PG Coleman, D Nash, CJ Edwardson, AP Knights, RM Gwilliam Journal of Applied Physics 110 (1), 2011 | 8 | 2011 |
Vacancy-type defects created by single-shot and chain ion implantation of silicon PG Coleman, CJ Edwardson, AP Knights, RM Gwilliam New Journal of Physics 14 (2), 025007, 2012 | 7 | 2012 |
Positron and positronium studies of silica aerogel CJ Edwardson, MDW Grogan, TA Birks, PG Coleman Journal of Physics: Conference Series 262 (1), 012018, 2011 | 7 | 2011 |
Positron annihilation studies of fluorine-vacancy complexes in Si and SiGe CJ Edwardson, PG Coleman, HAW El Mubarek, AS Gandy Journal of Applied Physics 111 (7), 2012 | 4 | 2012 |
Direct Observation of Electron Capture and Reemission by the Divacancy<? format?> via Charge Transient Positron Spectroscopy CJ Edwardson, PG Coleman, DJ Paez, JK Doylend, AP Knights Physical Review Letters 110 (13), 136401, 2013 | 3 | 2013 |
Inner workings of the 120C baking effect studied by positron annihilation A Romanenko, C Edwardson, P Coleman SRF materials workshop, 2012 | 3 | 2012 |
Positron Studies of Defects in Thin Films and Semiconductors CJ Edwardson University of Bath, 2013 | 2 | 2013 |
Defects in TiO2 films on p+-Si studied by positron annihilation spectroscopy PG Coleman, CJ Edwardson, A Zhang, X Ma, X Pi, D Yang Materials Science and Engineering: B 177 (8), 625-628, 2012 | 1 | 2012 |
Positron annihilation studies of the AlOₓ/SiO₂/Si interface in solar cell structures CJ Edwardson, PG Coleman, TTA Li, A Cuevas, S Ruffell American Institute of Physics (AIP), 2012 | | 2012 |
Yang, D.(2012) Defects in TiO 2 films on p+-Si studied by positron annihilation spectroscopy. Materials Science & Engineering B-Solid State Materials for Advanced Technology … PG Coleman, CJ Edwardson, A Zhang, X Ma, X Pi | | |
Slow positron beams-A unique and powerful tool in the development of advanced silicon devices AP Knights, JK Doylend, JDB Bradley, JJ Ackert, DF Logan, KJ Murray, ... | | |