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FABIAN LUIS VARGAS
FABIAN LUIS VARGAS
Doctor of Engineering, Head, Critical Systems - Senior Consultant
Verified email at computer.org
Title
Cited by
Cited by
Year
SEU-tolerant SRAM design based on current monitoring
F Vargas, M Nicolaidis
Proceedings of IEEE 24th International Symposium on Fault-Tolerant Computing …, 1994
1401994
A new hybrid fault detection technique for systems-on-a-chip
P Bernardi, LMV Bolzani, M Rebaudengo, MS Reorda, FL Vargas, ...
IEEE transactions on Computers 55 (2), 185-198, 2006
1022006
A FPGA-based Viterbi algorithm implementation for speech recognition systems
FL Vargas, RDR Fagundes, DB Júnior
2001 IEEE International Conference on Acoustics, Speech, and Signal …, 2001
532001
Electrocardiogram pattern recognition by means of MLP network and PCA: A case study on equal amount of input signal types
F Vargas, D Lettnin, MCF de Castro, M Macarthy
VII Brazilian Symposium on Neural Networks, 2002. SBRN 2002. Proceedings …, 2002
492002
Minería en Colombia. Derechos, políticas públicas y gobernanza
LJ Garay, M Cabrera, J Espitia
Contraloría General de la República 1, 2013
472013
Analysis of SRAM-based FPGA SEU sensitivity to combined EMI and TID-imprinted effects
J Benfica, B Green, BC Porcher, LB Poehls, F Vargas, NH Medina, ...
IEEE Transactions on Nuclear Science 63 (2), 1294-1300, 2016
452016
On the proposition of an EMI-based fault injection approach
F Vargas, DL Cavalcante, E Gatti, D Prestes, D Lupi
11th IEEE International On-Line Testing Symposium, 207-208, 2005
432005
Upset-tolerant cmos sram using current monitoring: Prototype and test experiments
T Calin, FL Vargas, M Nicolaidis
Proceedings of 1995 IEEE International Test Conference (ITC), 45-53, 1995
351995
Design and validation of configurable online aging sensors in nanometer-scale FPGAs
MD Valdes-Pena, JF Freijedo, MJM Rodriguez, JJ Rodriguez-Andina, ...
IEEE transactions on nanotechnology 12 (4), 508-517, 2013
342013
A low-cost, highly reliable SEU-tolerant SRAM: prototype and test results
T Calin, F Vargas, M Nicolaidis, R Velazco
IEEE Transactions on Nuclear Science 42 (6), 1592-1598, 1995
341995
Signal integrity enhancement in digital circuits
JFLC Semio, MJR Irago, JJ Rodriguez-Andina, LB Piccoli, FL Vargas, ...
IEEE Design & Test of Computers 25 (5), 452-461, 2008
332008
Design of built-in current sensors for concurrent checking in radiation environments
M Nicolaidis, F Vargas, B Courtois
IEEE Transactions on Nuclear Science 40 (6), 1584-1590, 1993
311993
Cuantificación y valoración de las tierras y los bienes abandonados o despojados a la población desplazada en Colombia
LJ Garay, F Barbery, S Perry, C Ramírez, F Vargas
Comisión de seguimiento a la política pública sobre el desplazamiento forzado, 2011
302011
Impact of power supply voltage variations on FPGA-based digital systems performance
J Freijedo, L Costas, J Semião, JJ Rodríguez-Andina, MJ Moure, ...
Journal of Low Power Electronics 6 (2), 339-349, 2010
292010
Reliability analysis of H-tree random access memories implemented with built in current sensors and parity codes for multiple bit upset correction
C Argyrides, R Chipana, F Vargas, DK Pradhan
IEEE Transactions on Reliability 60 (3), 528-537, 2011
272011
A hardware-scheduler for fault detection in RTOS-based embedded systems
J Tarrillo, LMB Pohls, F Vargas
2009 12th Euromicro Conference on digital system design, architectures …, 2009
262009
Dynamic fault test and diagnosis in digital systems using multiple clock schemes and multi-vdd test
M Rodriguez-Irago, JJR Andina, F Vargas, MB Santos, IC Teixeira, ...
11th IEEE International On-Line Testing Symposium, 281-286, 2005
262005
Estimating circuit fault-tolerance by means of transient-fault injection in VHDL
F Vargas, A Amory, R Velazco
Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No …, 2000
262000
On-chip aging sensor to monitor NBTI effect in nano-scale SRAM
A Ceratti, T Copetti, L Bolzani, F Vargas
2012 IEEE 15th International Symposium on Design and Diagnostics of …, 2012
252012
Improving reconfigurable systems reliability by combining periodical test and redundancy techniques: a case study
EA Bezerra, F Vargas, MP Gough
Journal of Electronic Testing 17 (2), 163-174, 2001
252001
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