| SEU-tolerant SRAM design based on current monitoring F Vargas, M Nicolaidis Proceedings of IEEE 24th International Symposium on Fault-Tolerant Computing …, 1994 | 140 | 1994 |
| A new hybrid fault detection technique for systems-on-a-chip P Bernardi, LMV Bolzani, M Rebaudengo, MS Reorda, FL Vargas, ... IEEE transactions on Computers 55 (2), 185-198, 2006 | 100 | 2006 |
| A FPGA-based Viterbi algorithm implementation for speech recognition systems FL Vargas, RDR Fagundes, DB Júnior 2001 IEEE International Conference on Acoustics, Speech, and Signal …, 2001 | 52 | 2001 |
| Minería en Colombia: derechos, políticas públicas y gobernanza LJ Garay, M Cabrera, J Espitia Contraloría General de la República 1, 2013 | 49 | 2013 |
| Electrocardiogram pattern recognition by means of MLP network and PCA: A case study on equal amount of input signal types F Vargas, D Lettnin, MCF de Castro, M Macarthy VII Brazilian Symposium on Neural Networks, 2002. SBRN 2002. Proceedings …, 2002 | 49 | 2002 |
| Analysis of SRAM-based FPGA SEU sensitivity to combined EMI and TID-imprinted effects J Benfica, B Green, BC Porcher, LB Poehls, F Vargas, NH Medina, ... IEEE Transactions on Nuclear Science 63 (2), 1294-1300, 2016 | 45 | 2016 |
| On the proposition of an EMI-based fault injection approach F Vargas, DL Cavalcante, E Gatti, D Prestes, D Lupi 11th IEEE International On-Line Testing Symposium, 207-208, 2005 | 43 | 2005 |
| A low-cost, highly reliable SEU-tolerant SRAM: prototype and test results T Calin, F Vargas, M Nicolaidis, R Velazco IEEE Transactions on Nuclear Science 42 (6), 1592-1598, 1995 | 35 | 1995 |
| Upset-tolerant cmos sram using current monitoring: Prototype and test experiments T Calin, FL Vargas, M Nicolaidis Proceedings of 1995 IEEE International Test Conference (ITC), 45-53, 1995 | 35 | 1995 |
| Signal integrity enhancement in digital circuits JFLC Semio, MJR Irago, JJ Rodriguez-Andina, LB Piccoli, FL Vargas, ... IEEE Design & Test of Computers 25 (5), 452-461, 2008 | 33 | 2008 |
| Design and validation of configurable online aging sensors in nanometer-scale FPGAs MD Valdes-Pena, JF Freijedo, MJM Rodriguez, JJ Rodriguez-Andina, ... IEEE Transactions on Nanotechnology 12 (4), 508-517, 2013 | 32 | 2013 |
| Cuantificación y valoración de las tierras y los bienes abandonados o despojados a la población desplazada en Colombia LJ Garay, F Barbery, S Perry, C Ramírez, F Vargas Comisión de seguimiento a la política pública sobre el desplazamiento forzado, 2011 | 32 | 2011 |
| Design of built-in current sensors for concurrent checking in radiation environments M Nicolaidis, F Vargas, B Courtois IEEE Transactions on Nuclear Science 40 (6), 1584-1590, 1993 | 32 | 1993 |
| Impact of power supply voltage variations on FPGA-based digital systems performance J Freijedo, L Costas, J Semião, JJ Rodríguez-Andina, MJ Moure, ... Journal of Low Power Electronics 6 (2), 339-349, 2010 | 29 | 2010 |
| Reliability analysis of H-tree random access memories implemented with built in current sensors and parity codes for multiple bit upset correction C Argyrides, R Chipana, F Vargas, DK Pradhan IEEE Transactions on Reliability 60 (3), 528-537, 2011 | 27 | 2011 |
| A hardware-scheduler for fault detection in RTOS-based embedded systems J Tarrillo, LMB Pohls, F Vargas 2009 12th Euromicro Conference on digital system design, architectures …, 2009 | 26 | 2009 |
| Dynamic fault test and diagnosis in digital systems using multiple clock schemes and multi-vdd test M Rodriguez-Irago, JJR Andina, F Vargas, MB Santos, IC Teixeira, ... 11th IEEE International On-Line Testing Symposium, 281-286, 2005 | 26 | 2005 |
| Estimating circuit fault-tolerance by means of transient-fault injection in VHDL F Vargas, A Amory, R Velazco Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No …, 2000 | 26 | 2000 |
| On-chip aging sensor to monitor NBTI effect in nano-scale SRAM A Ceratti, T Copetti, L Bolzani, F Vargas 2012 IEEE 15th International Symposium on Design and Diagnostics of …, 2012 | 25 | 2012 |
| Improving reconfigurable systems reliability by combining periodical test and redundancy techniques: a case study EA Bezerra, F Vargas, MP Gough Journal of Electronic Testing 17 (2), 163-174, 2001 | 25 | 2001 |
Paulo TeixeiraINESC-ID, IST, Univ. Lisboa, PortugalVerified email at ist.utl.pt
