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Thomas Walther
Thomas Walther
Reader in Advanced Electron Microscopy, University of Sheffield
Verified email at sheffield.ac.uk - Homepage
Title
Cited by
Cited by
Year
Structural and doping effects in the half-metallic double perovskite A 2 CrWO 6 (A= Sr, Ba, and Ca)
JB Philipp, P Majewski, L Alff, A Erb, R Gross, T Graf, MS Brandt, J Simon, ...
Physical Review B 68 (14), 144431, 2003
3602003
Nature of the Stranski-Krastanow transition during epitaxy of InGaAs on GaAs
T Walther, AG Cullis, DJ Norris, M Hopkinson
Physical Review Letters 86 (11), 2381, 2001
3152001
Coexistence of clusters, GPB zones, S ″-, S′-and S-phases in an Al–0.9% Cu–1.4% Mg alloy
A Charai, T Walther, C Alfonso, AM Zahra, CY Zahra
Acta materialia 48 (10), 2751-2764, 2000
2032000
Stranski-Krastanow transition and epitaxial island growth
AG Cullis, DJ Norris, T Walther, MA Migliorato, M Hopkinson
Physical Review B 66 (8), 081305, 2002
1472002
Laser-assisted synthesis of Au− Ag alloy nanoparticles in solution
Z Peng, B Spliethoff, B Tesche, T Walther, K Kleinermanns
The Journal of Physical Chemistry B 110 (6), 2549-2554, 2006
1062006
Observation of vertical and lateral Ge segregation in thin undulating SiGe layers on Si by electron energy-loss spectroscopy
T Walther, CJ Humphreys, AG Cullis
Applied physics letters 71 (6), 809-811, 1997
1051997
Structure and chemistry of basal‐plane inversion boundaries in antimony oxide‐doped zinc oxide
A Rečnik, N Daneu, T Walther, W Mader
Journal of the American Ceramic Society 84 (11), 2657-2668, 2001
1022001
Combinatorial investigation of the isolated nanoparticle to coalescent layer transition in a gradient sputtered gold nanoparticle layer on top of polystyrene
SV Roth, H Walter, M Burghammer, C Riekel, B Lengeler, C Schroer, ...
Applied physics letters 88 (2), 021910, 2006
642006
Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning
AJV Griffiths, T Walther
Journal of Physics: Conference Series 241 (1), 012017, 2010
572010
A quantitative study of compositional profiles of chemical vapour-deposited strained silicon–germanium/silicon layers by transmission electron microscopy
T Walther, CJ Humphreys
Journal of crystal growth 197 (1-2), 113-128, 1999
561999
A new experimental procedure to quantify annular dark field images in scanning transmission electron microscopy
T Walther
Journal of microscopy 221 (2), 137-144, 2006
542006
Photofragmentation of phase-transferred gold nanoparticles by intense pulsed laser light
Z Peng, T Walther, K Kleinermanns
The Journal of Physical Chemistry B 109 (33), 15735-15740, 2005
532005
Influence of intense pulsed laser irradiation on optical and morphological properties of gold nanoparticle aggregates produced by surface acid− base reactions
Z Peng, T Walther, K Kleinermanns
Langmuir 21 (10), 4249-4253, 2005
532005
Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces
T Walther
Ultramicroscopy 96 (3-4), 401-411, 2003
472003
InAs quantum dots grown on a GaAs substrate using a GaAsSb metamorphic buffer layer
HY Liu, Y Qiu, CY Jin, T Walther, AG Cullis
Applied Physics Letters 92 (11), 111906, 2008
462008
Diffusion and segregation effects in doped manganite/titanate heterostructures
J Simon, T Walther, W Mader, J Klein, D Reisinger, L Alff, R Gross
Applied physics letters 84 (19), 3882-3884, 2004
462004
Defects, strain relaxation, and compositional grading in high indium content InGaN epilayers grown by molecular beam epitaxy
C Bazioti, E Papadomanolaki, T Kehagias, T Walther, ...
Journal of Applied Physics 118 (15), 155301, 2015
452015
Homogeneous array of nanowire-embedded quantum light emitters
MN Makhonin, AP Foster, AB Krysa, PW Fry, DG Davies, T Grange, ...
Nano letters 13 (3), 861-865, 2013
452013
A correlation between compositional fluctuations and surface undulations in strained layer epitaxy
T Walther, CJ Humphreys, AG Cullis, DJ Robbins
Materials science forum 196, 505-510, 1995
401995
First experimental test of a new monochromated and aberration-corrected 200 kV field-emission scanning transmission electron microscope
T Walther, E Quandt, H Stegmann, A Thesen, G Benner
Ultramicroscopy 106 (11-12), 963-969, 2006
392006
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