| Phonon polarization deformation in graphene induced by substrate coupling strengths YC Chang, B Das, YF Chiang, WH Chang, YC Chen, R Kesarwani, ... Applied Physics Letter 122, 032201, 2023 | 1 | 2023 |
| Experimental demonstration of in situ surface and thickness profile measurements of thin film during deposition using a grating array based wavefront sensor N Kumar, B Pathak, R Kesarwani, S Goswami, AK Boruah, ... Optics Letters 47 (21), 5509, 2022 | 5 | 2022 |
| Effect of annealing on the stoichiometry and plasmonic properties of PLD nanostructured semi-transparent copper thin film using BEMA R Kesarwani, A Khare Journal of Materials Science: Materials in Electronics 33 (23), 18209-18219, 2022 | | 2022 |
| Control of Trion-to-Exciton Conversion in Monolayer WS2 by Orbital Angular Momentum of Light R Kesarwani, KB Simbulan, TD Huang, YF Chiang, NC Yeh*, YW Lan*, ... Science Advances 8, 1-8, 2022 | 19 | 2022 |
| Electronic Speckle Pattern Interference technique for measuring thickness of metallic nano thin films NB Bhagat, PP Padghan, R Kesarwani, A Khare, KM Alti Materials Today: Proceedings 50, 123-128, 2022 | 1 | 2022 |
| System, apparatus and method for monitoring of surface profile and thickness measurement in thin films BPRK Bosanta Ranjan Boruah, Alika Khare JP Patent 2018-549,636, 2021 | | 2021 |
| System, apparatus and method for monitoring of surface profile and thickness measurement in thin films BR Boruah, A Khare, B Pathak, R Kesarwani US Patent App. 16/061,615, 2020 | 1 | 2020 |
| Anomalous Scaling Behavior of Cu Film via Pulsed Laser Deposition and Correlation with SPR Properties PPDAK Rahul Kesarwani Advances in Science and Technology 11, 61, 2020 | | 2020 |
| Assessment of interfacial layer thickness of pulsed laser deposited plasmonic copper thin films via spectroscopic ellipsometer R Kesarwani, A Khare Optical Materials 93, 98-102, 2019 | 6 | 2019 |
| Correlation between surface scaling behavior and surface plasmon resonance properties of semitransparent nanostructured Cu thin films deposited via PLD R Kesarwani, PP Dey, A Khare RSC advances 9 (14), 7967-7974, 2019 | 25 | 2019 |
| Linear and non linear optical properties surface plasmon resonance and surface scaling behaviour of nanostructured cu thin films fabricated via pld technique R Kesarwani Guwahati, 2019 | | 2019 |
| Efficacy of Raman mapping over ellipsometric spectroscopy and XRD for characterization of structurally heterogeneous PLD nc-Si thin films PP Dey, R Kesarwani, A Khare Optical Materials 84, 221-226, 2018 | 2 | 2018 |
| Surface plasmon resonance and nonlinear optical behavior of pulsed laser-deposited semitransparent nanostructured copper thin films R Kesarwani, A Khare Applied Physics B 124, 1-8, 2018 | 8 | 2018 |
| Compositional study of pulsed laser deposited semitransparent Cu thin film using BEMA R Kesarwani, A Khare AIP Conference Proceedings 1942 (1), 080045, 2018 | | 2018 |
| Thickness dependent optical properties of MoS2 thin films probed by spectroscopic ellipsometry G Pradhan, R Kesarwani, A Khare, AK Sharma International Conference on Fibre Optics and Photonics, P1A. 14, 2016 | 1 | 2016 |
| Plasmonic interaction between copper nanoparticles and metallic single walled carbon nanotubes R Kesarwani, H Chaturvedi, A Khare International Conference on Fibre Optics and Photonics, P1A. 18, 2016 | 1 | 2016 |
