| Improving axial resolution in spectral domain low-coherence interferometry through fast Fourier transform harmonic artifacts MP Raele, LVG Tarelho, CL da Silva Azeredo, IB Couceiro, AZ Freitas Optical Engineering 53 (7), 073106-073106, 2014 | 9 | 2014 |
| Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration reference IB Couceiro, TF Da Silva, LVG Tarelho, CLS Azeredo, I Malinovski, ... Optical Measurement Systems for Industrial Inspection VII 8082, 817-826, 2011 | 5 | 2011 |
| Primary Imaging Interference Microscope for Nanometrology I Malinovsky, RS Franca, IB Couceiro, MS Lima, CLS Azeredo, ... XX IMEKO World Congress Metrology for Green Growth, September, Busan …, 2012 | 4 | 2012 |
| Imaging interference microscope for nanometrology I Malinovsky, IB Couceiro, RS Franca, MS Lima, CLS Azeredo, ... Acta Imeko 3 (3), 28-32, 2014 | 3 | 2014 |
| Traceability transfer in high accuracy contact temperature measurements for length interferometry PA Costa, MS Bessa, JS Schutz, CLS Azeredo, RS França, KN Quelhas, ... Journal of Physics: Conference Series 575 (1), 012025, 2015 | | 2015 |
| Validação de bancada experimental para investigação metrológica de escoamento bifásico (ar-água) em tubulação horizontal IT Chacon, AM Santos, CL Azeredo, DA Garcia, E Silva, MH Farias | | 2015 |
| PRIMARY TRACEABLE NANOMETROLOGY AT INMETRO BASED ON THE INTERFERENCE MICROSCOPE AND AFM CALIBRATION I Malinovsky, RS Franca, LVG Tarelho, IB Couceiro, CLS Azeredo, C MS | | |
