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Martin Mikulics
Martin Mikulics
Ernst-Ruska Centre (ER-C-2), Forschungszentrum Jülich
Verified email at fz-juelich.de
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Cited by
Year
Tuning of fluorine content in graphene: towards large-scale production of stoichiometric fluorographene
V Mazánek, O Jankovský, J Luxa, D Sedmidubský, Z Janoušek, ...
Nanoscale 7 (32), 13646-13655, 2015
1672015
Monitoring polymeric compounding processes inline with THz time-domain spectroscopy
N Krumbholz, T Hochrein, N Vieweg, T Hasek, K Kretschmer, M Bastian, ...
Polymer testing 28 (1), 30-35, 2009
1512009
Molecular properties of liquid crystals in the terahertz frequency range
N Vieweg, C Jansen, MK Shakfa, M Scheller, N Krumbholz, R Wilk, ...
Optics express 18 (6), 6097-6107, 2010
1112010
Polarization sensitive terahertz imaging: detection of birefringence and optical axis
S Katletz, M Pfleger, H Pühringer, M Mikulics, N Vieweg, O Peters, ...
Optics Express 20 (21), 23025-23035, 2012
1042012
Continuous wave terahertz spectrometer as a noncontact thickness measuring device
R Wilk, F Breitfeld, M Mikulics, M Koch
Applied Optics 47 (16), 3023-3026, 2008
952008
THz properties of nematic liquid crystals
N Vieweg, MK Shakfa, B Scherger, M Mikulics, M Koch
Journal of Infrared, Millimeter, and Terahertz Waves 31, 1312-1320, 2010
792010
Terahertz birefringence for orientation analysis
C Jördens, M Scheller, M Wichmann, M Mikulics, K Wiesauer, M Koch
Applied optics 48 (11), 2037-2044, 2009
732009
Femtosecond response of a free-standing LT-GaAs photoconductive switch
X Zheng, Y Xu, R Sobolewski, R Adam, M Mikulics, M Siegel, P Kordoš
Applied optics 42 (9), 1726-1731, 2003
722003
High-power monolithic two-mode DFB laser diodes for the generation of THz radiation
A Klehr, J Fricke, A Knauer, G Erbert, M Walther, R Wilk, M Mikulics, ...
IEEE Journal of Selected Topics in Quantum Electronics 14 (2), 289-294, 2008
712008
Impact of the contact metallization on the performance of photoconductive THz antennas
N Vieweg, M Mikulics, M Scheller, K Ezdi, R Wilk, HW Hübers, M Koch
Optics express 16 (24), 19695-19705, 2008
652008
Industrial applications of THz systems
S Wietzke, C Jansen, C Jördens, N Krumbholz, N Vieweg, M Scheller, ...
International Symposium on Photoelectronic Detection and Imaging 2009 …, 2009
562009
Insight into the mechanism of the thermal reduction of graphite oxide: Deuterium-labeled graphite oxide is the key
Z Sofer, O Jankovsky, P Simek, D Sedmidubsky, J Sturala, J Kosina, ...
ACS nano 9 (5), 5478-5485, 2015
552015
Large-area traveling-wave photonic mixers for increased continuous terahertz power
EA Michael, B Vowinkel, R Schieder, M Mikulics, M Marso, P Kordoš
Applied physics letters 86 (11), 2005
552005
Modern chemical synthesis methods towards low-dimensional phase change structures in the Ge–Sb–Te material system
H Hardtdegen, M Mikulics, S Riess, M Schuck, T Saltzmann, U Simon, ...
Progress in crystal growth and characterization of materials 61 (2-4), 27-45, 2015
522015
Ultrafast metal-semiconductor-metal photodetectors on low-temperature-grown GaN
M Mikulics, M Marso, P Javorka, P Kordoš, H Lüth, M Kočan, A Rizzi, ...
Applied physics letters 86 (21), 2005
512005
Nano-LED array fabrication suitable for future single photon lithography
M Mikulics, H Hardtdegen
Nanotechnology 26 (18), 185302, 2015
492015
A model structure for interfacial phase change memories: Epitaxial trigonal Ge1Sb2Te4
H Hardtdegen, S Rieß, M Schuck, K Keller, P Jost, H Du, M Bornhöfft, ...
Journal of alloys and compounds 679, 285-292, 2016
472016
RF Performance of InAlN/GaN HFETs and MOSHFETs Withup to 21
P Kordos, M Mikulics, A Fox, D Gregusova, K Cico, JF Carlin, ...
IEEE electron device letters 31 (3), 180-182, 2010
452010
A novel THz source based on a two-color Nd: LSB microchip-laser and a LT-GaAsSb photomixer
U Willer, R Wilk, W Schippers, S Böttger, D Nodop, T Schossig, W Schade, ...
Applied Physics B 87, 13-16, 2007
452007
Fiber-coupled THz spectroscopy for monitoring polymeric compounding processes
N Vieweg, N Krumbholz, T Hasek, R Wilk, V Bartels, C Keseberg, ...
Optical Measurement Systems for Industrial Inspection V 6616, 1063-1070, 2007
432007
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