Založit si vlastní profil
Spoluautoři
- Wan ChoiProfessor, Department of Electrical and Computer Engineering, Seoul National University (SNU)E-mailová adresa ověřena na: snu.ac.kr
- Bang Chul JungProfessor, Dept. of EE, Chungnam National Univ.E-mailová adresa ověřena na: cnu.ac.kr
- Myung Gil KangSamsung ElectronicsE-mailová adresa ověřena na: samsung.com
- Dae kyu ShinPh.D., Korea Advanced Institute of Science and TechnologyE-mailová adresa ověřena na: kaist.ac.kr
- JeongSeon Yeom, Ph.D.Assistant Professor, Sch. of EE, Hankyong National UniversityE-mailová adresa ověřena na: hknu.ac.kr
- Bi HongAgency for Defense DevelopmentE-mailová adresa ověřena na: add.re.kr
- Rony Kumer Saha, Ph.D.STANFORD UNIVERSITY, USA (DSM Research Group, STAR Lab, Electrical Engineering)E-mailová adresa ověřena na: stanford.edu
- Aria NosratiniaUniversity of Texas at DallasE-mailová adresa ověřena na: utdallas.edu
- Jung Hoon LeeHankuk University of Foreign StudiesE-mailová adresa ověřena na: hufs.ac.kr
Sledovat
Youngbin Kim, Ph.D.
Field Application Engineer, VIAVI Solutions, Inc.
E-mailová adresa ověřena na: viavisolutions.com